Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy by Martin Schloffer; Christian Teichert; Peter Supancic; Andrei Andreev; Yue Hou; Zhonghua Wang

Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy by Martin Schloffer; Christian Teichert; Peter Supancic; Andrei Andreev; Yue Hou; Zhonghua Wang

Author:Martin Schloffer; Christian Teichert; Peter Supancic; Andrei Andreev; Yue Hou; Zhonghua Wang
Format: pdf
Publisher: Elsevier Ltd
Published: 2010-02-24T17:20:08+00:00


Download



Copyright Disclaimer:
This site does not store any files on its server. We only index and link to content provided by other sites. Please contact the content providers to delete copyright contents if any and email us, we'll remove relevant links or contents immediately.